{"id":1176,"date":"2017-06-09T11:19:39","date_gmt":"2017-06-09T09:19:39","guid":{"rendered":"https:\/\/blog.rwth-aachen.de\/ac-ces-2017\/?page_id=1176"},"modified":"2017-06-09T11:21:55","modified_gmt":"2017-06-09T09:21:55","slug":"talk-peter-binev","status":"publish","type":"page","link":"https:\/\/blog.rwth-aachen.de\/ac-ces-2017\/talk-peter-binev\/","title":{"rendered":"Peter Binev"},"content":{"rendered":"<h2>Approximation\u00a0Methods In Electron Microscopy<\/h2>\n<p>Electron microscopy and in particular Scanning Transmission\u00a0Electron Microscopy (STEM) has made tremendous\u00a0advances in the instrumentation\u00a0in the last couple of decades. These improvements allowed the scientists to\u00a0observe\u00a0materials at the picometre scale. However, the use of standard data\u00a0processing has not allowed the extraction of all the\u00a0available information. The\u00a0structure of the noise is very complex and is far from being fully understood.\u00a0The dominant\u00a0presence of spatial distortions requires new mathematical tools\u00a0and methods to better understand and process the STEM\u00a0data.<\/p>\n<p>The talk will give a short introduction to the specifics of\u00a0STEM data and will focus on its modeling that allows its better\u00a0understanding\u00a0from a mathematical point of view. A particular topic is the non-rigid\u00a0registration and averaging of series\u00a0of aberration-corrected Z-contrast STEM\u00a0images to demonstrate sub-picometre precision measurements of atom\u00a0positions\u00a0and achieve five to seven times better precision than previous methods. Another\u00a0one is improvements of the\u00a0alignment procedure for electron tomography and the development\u00a0of a tomographic reconstruction based on partial\u00a0segmentation. Some problems\u00a0related to energy-dispersive X-ray spectroscopy will be discussed as well.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Approximation\u00a0Methods In Electron Microscopy Electron microscopy and in particular Scanning Transmission\u00a0Electron Microscopy (STEM) has made tremendous\u00a0advances in the instrumentation\u00a0in the last couple of decades. These improvements allowed the scientists to\u00a0observe\u00a0materials [&hellip;]<\/p>\n","protected":false},"author":1060,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"c2c_always_allow_admin_comments":false,"footnotes":""},"class_list":["post-1176","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/blog.rwth-aachen.de\/ac-ces-2017\/wp-json\/wp\/v2\/pages\/1176","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blog.rwth-aachen.de\/ac-ces-2017\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/blog.rwth-aachen.de\/ac-ces-2017\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/blog.rwth-aachen.de\/ac-ces-2017\/wp-json\/wp\/v2\/users\/1060"}],"replies":[{"embeddable":true,"href":"https:\/\/blog.rwth-aachen.de\/ac-ces-2017\/wp-json\/wp\/v2\/comments?post=1176"}],"version-history":[{"count":1,"href":"https:\/\/blog.rwth-aachen.de\/ac-ces-2017\/wp-json\/wp\/v2\/pages\/1176\/revisions"}],"predecessor-version":[{"id":1177,"href":"https:\/\/blog.rwth-aachen.de\/ac-ces-2017\/wp-json\/wp\/v2\/pages\/1176\/revisions\/1177"}],"wp:attachment":[{"href":"https:\/\/blog.rwth-aachen.de\/ac-ces-2017\/wp-json\/wp\/v2\/media?parent=1176"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}