{"id":2667,"date":"2022-10-18T12:45:03","date_gmt":"2022-10-18T10:45:03","guid":{"rendered":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/?p=2667"},"modified":"2022-10-18T12:45:03","modified_gmt":"2022-10-18T10:45:03","slug":"richtlinien-fuer-die-auswertung-neuartiger-feldeffekttransistoren","status":"publish","type":"post","link":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/richtlinien-fuer-die-auswertung-neuartiger-feldeffekttransistoren\/","title":{"rendered":"How to report and benchmark emerging field-effect transistors"},"content":{"rendered":"<div class=\"twoclick_social_bookmarks_post_2667 social_share_privacy clearfix 1.6.4 locale-en_US sprite-en_US\"><\/div><div class=\"twoclick-js\"><script type=\"text\/javascript\">\/* <![CDATA[ *\/\njQuery(document).ready(function($){if($('.twoclick_social_bookmarks_post_2667')){$('.twoclick_social_bookmarks_post_2667').socialSharePrivacy({\"services\":{\"facebook\":{\"status\":\"on\",\"txt_info\":\"2 Klicks f\\u00fcr mehr Datenschutz: Erst wenn Sie hier klicken, wird der Button aktiv und Sie k\\u00f6nnen Ihre Empfehlung an Facebook senden. Schon beim Aktivieren werden Daten an Dritte \\u00fcbertragen - siehe <em>i<\\\/em>.\",\"perma_option\":\"off\",\"action\":\"recommend\",\"language\":\"en_US\"}},\"txt_help\":\"Wenn Sie diese Felder durch einen Klick aktivieren, werden Informationen an Facebook, Twitter, Flattr, Xing, t3n, LinkedIn, Pinterest oder Google eventuell ins Ausland \\u00fcbertragen und unter Umst\\u00e4nden auch dort gespeichert. N\\u00e4heres erfahren Sie durch einen Klick auf das <em>i<\\\/em>.\",\"settings_perma\":\"Dauerhaft aktivieren und Daten\\u00fcber-tragung zustimmen:\",\"info_link\":\"http:\\\/\\\/www.heise.de\\\/ct\\\/artikel\\\/2-Klicks-fuer-mehr-Datenschutz-1333879.html\",\"uri\":\"https:\\\/\\\/blog.rwth-aachen.de\\\/elektrotechnik\\\/en\\\/richtlinien-fuer-die-auswertung-neuartiger-feldeffekttransistoren\\\/\",\"post_id\":2667,\"post_title_referrer_track\":\"How+to+report+and+benchmark+emerging+field-effect+transistors\",\"display_infobox\":\"on\"});}});\n\/* ]]> *\/<\/script><\/div><p><div id=\"attachment_2685\" style=\"width: 1033px\" class=\"wp-caption alignright\"><img loading=\"lazy\" decoding=\"async\" aria-describedby=\"caption-attachment-2685\" class=\"wp-image-2685 size-full\" src=\"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/files\/2022\/10\/DSF5439_crop-3.jpg\" alt=\"Messungen an einem Graphen-basierten FET in einer Messstation bei AMO. Photo: \u00a9AMO GmbH\" width=\"1023\" height=\"678\" srcset=\"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/files\/2022\/10\/DSF5439_crop-3.jpg 1023w, https:\/\/blog.rwth-aachen.de\/elektrotechnik\/files\/2022\/10\/DSF5439_crop-3-300x199.jpg 300w, https:\/\/blog.rwth-aachen.de\/elektrotechnik\/files\/2022\/10\/DSF5439_crop-3-768x509.jpg 768w\" sizes=\"auto, (max-width: 1023px) 100vw, 1023px\" \/><p id=\"caption-attachment-2685\" class=\"wp-caption-text\">Messungen an einem Graphen-basierten FET in einer Messstation bei AMO. Photo: \u00a9AMO GmbH<\/p><\/div><\/p>\n<p>One of the challenges encountered by research on novel electronic devices is to compare devices based on different materials in a consistent way. RWTH Professor Max Lemme and colleagues from USA, China, and Belgium have now proposed a set of clear guidelines for benchmarking key parameters and performance metrics of emergent field-effect transistors. The guidelines have been published as a Perspective Article in Nature Electronics.<\/p>\n<p>Research on field-effect transistors (FET) has long explored the possibility of replacing silicon as channel material with emerging nanomaterials, such as carbon nanotubes, graphene, transition metal dichalcogenides, organic semiconductors, or ultrathin oxides. The field is thriving and keeps uncovering fundamental aspects of these materials. But when it comes to comparing the performance of different devices, there is often a lack of consistent reporting and benchmarking<\/p>\n<p>\u201cAssessing consistently the potential of new materials for novel transistors is difficult, because the performance depends on many aspects and details of the device structure, and many parameters are interdependent.\u201d explains Prof. Lemme. Further complexity is added to the field by the interdisciplinarity of the research community, which includes electrical engineers, chemists, materials scientist and physicists. The multitude of approaches increases the challenge of reporting and benchmarking results consistently.<\/p>\n<p>To address this situation, Lemme and colleagues have prepared a checklist of device parameters to be reported, as well as a list of recommended benchmarking plots to compare device parameters and performance metrics. In addition, they present an explicit example of how to use the proposed procedure by applying it to the case of FETs based on monolayer molybdenum disulfide (MoS<sub>2<\/sub>), which is one of the emerging materials most studied in recent years for transistor application.<\/p>\n<p>\u201cTo identify the real advantages and opportunities offered by novel materials in the search for improved transistors, we need to be able to benchmark and report different devices in a consistent way. We also need to make sure that all relevant data are reported every time.\u201d adds Lemme. \u201cWe hope that our work will contribute to bring clarity in the community and guide the search for even better devices.\u201d<\/p>\n<p><u>Bibliographic info<\/u><br \/>\n\u201cHow to report and benchmark emerging field-effect transistors\u201d<br \/>\nZ. Cheng, C.-S. Pang, P. Wang, S. T. Le, Y. Wu, D. Shahrjerdi, I. Radu, M. C. Lemme, L.-M. Peng, X. Duan, Z. Chen, J. Appenzeller, S. J. Koester, E. Pop, A. D. Franklin, and C. A. Richter, <em>Nature Electronics<\/em> <strong>5<\/strong>, 416\u2013423 (2022).<br \/>\nDOI: <a href=\"https:\/\/doi.org\/10.1038\/s41928-022-00798-8\">https:\/\/doi.org\/10.1038\/s41928-022-00798-8<\/a><\/p>\n<p><strong>Contact:<\/strong><br \/>\nAMO GmbH, Gesellschaft f\u00fcr Angewandte Mikro- und Optoelektronik<br \/>\nOtto-Blumenthal-Str.25S<br \/>\n52074 Aachen<br \/>\n<a href=\"mailto:haupt@amo.de\">haupt@amo.de<\/a><\/p>","protected":false},"excerpt":{"rendered":"<p>One of the challenges encountered by research on novel electronic devices is to compare devices based on different materials in a consistent way. RWTH Professor Max Lemme and colleagues from [&hellip;]<\/p>\n","protected":false},"author":4543,"featured_media":2685,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"c2c_always_allow_admin_comments":false,"footnotes":""},"categories":[1,11],"tags":[],"class_list":["post-2667","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-allgemein","category-mikro-und-nanoeletronik"],"_links":{"self":[{"href":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/wp-json\/wp\/v2\/posts\/2667","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/wp-json\/wp\/v2\/users\/4543"}],"replies":[{"embeddable":true,"href":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/wp-json\/wp\/v2\/comments?post=2667"}],"version-history":[{"count":35,"href":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/wp-json\/wp\/v2\/posts\/2667\/revisions"}],"predecessor-version":[{"id":2711,"href":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/wp-json\/wp\/v2\/posts\/2667\/revisions\/2711"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/wp-json\/wp\/v2\/media\/2685"}],"wp:attachment":[{"href":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/wp-json\/wp\/v2\/media?parent=2667"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/wp-json\/wp\/v2\/categories?post=2667"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blog.rwth-aachen.de\/elektrotechnik\/en\/wp-json\/wp\/v2\/tags?post=2667"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}